help interpret this SMART data?

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BLinux

cat lover server enthusiast
Jul 7, 2016
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just picked up an old laptop hard drive for kid's computer. not sure how to interpret this SMART data from smartctl output. Is there anything I should worry about? This isn't going to have important data on it, but the errors have me concerned and I don't want to waste time setting up OS on this if it is going to crap out soon.

smartctl 6.5 2016-05-07 r4318 [i686-linux-4.8.6-300.fc25.i686+PAE] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family: Fujitsu MHY BH
Device Model: FUJITSU MHY2250BH
Serial Number: K432T7C267HL
LU WWN Device Id: 5 00000e 0415ce039
Firmware Version: 0085000B
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 3f
SATA Version is: SATA 2.5, 1.5 Gb/s
Local Time is: Sat Mar 25 14:50:38 2017 PDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 1009) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 143) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 046 Pre-fail Always - 196383
3 Spin_Up_Time 0x0003 100 100 025 Pre-fail Always - 1
4 Start_Stop_Count 0x0032 092 092 000 Old_age Always - 168640
5 Reallocated_Sector_Ct 0x0033 100 100 024 Pre-fail Always - 0 (2000 0)
9 Power_On_Hours 0x0032 075 075 000 Old_age Always - 776120
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 2395
191 G-Sense_Error_Rate 0x0012 100 100 000 Old_age Always - 1095
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 140
194 Temperature_Celsius 0x0022 100 040 000 Old_age Always - 38 (Min/Max 5/72)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 2785 (0 11)
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 131952402300931
198 Offline_Uncorrectable 0x0032 100 100 000 Old_age Always - 50603392040964
199 UDMA_CRC_Error_Count 0x0032 100 100 000 Old_age Always - 91555785
200 Multi_Zone_Error_Rate 0x0032 100 100 000 Old_age Always - 259507976

SMART Error Log Version: 1
ATA Error Count: 128 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 128 occurred at disk power-on lifetime: 7571 hours (315 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 41 2b f7 19 0a 40 Error: UNC at LBA = 0x000a19f7 = 662007

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 11 38 78 19 0a 40 00 1d+08:46:45.286 READ FPDMA QUEUED
60 80 30 a0 06 0a 40 00 1d+08:46:45.275 READ FPDMA QUEUED
60 09 28 80 19 0a 40 00 1d+08:46:45.275 READ FPDMA QUEUED
60 80 20 20 06 0a 40 00 1d+08:46:45.273 READ FPDMA QUEUED
60 80 18 a0 05 0a 40 00 1d+08:46:45.272 READ FPDMA QUEUED

Error 127 occurred at disk power-on lifetime: 7222 hours (300 days + 22 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 41 13 77 63 44 40 Error: UNC at LBA = 0x00446377 = 4481911

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 48 c0 d6 84 40 00 00:37:52.475 READ FPDMA QUEUED
60 08 40 c0 a3 f8 40 00 00:37:52.475 READ FPDMA QUEUED
60 01 38 c0 a3 f8 40 00 00:37:52.475 READ FPDMA QUEUED
61 38 30 98 a1 a0 40 00 00:37:52.475 WRITE FPDMA QUEUED
61 08 28 f0 56 47 40 00 00:37:52.475 WRITE FPDMA QUEUED

Error 126 occurred at disk power-on lifetime: 7222 hours (300 days + 22 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 41 13 ef 35 46 40 Error: WP at LBA = 0x004635ef = 4601327

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 10 40 60 6d 5b 40 00 00:36:32.451 WRITE FPDMA QUEUED
61 01 38 40 e2 4a 40 00 00:36:32.451 WRITE FPDMA QUEUED
60 00 30 c0 d6 84 40 00 00:36:32.451 READ FPDMA QUEUED
60 40 28 e2 d6 53 40 00 00:36:32.451 READ FPDMA QUEUED
60 18 20 30 e9 50 40 00 00:36:32.451 READ FPDMA QUEUED

Error 125 occurred at disk power-on lifetime: 7222 hours (300 days + 22 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 41 5b ea d6 84 40 Error: WP at LBA = 0x0084d6ea = 8705770

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 08 78 f0 56 47 40 00 00:34:33.732 WRITE FPDMA QUEUED
60 08 70 c0 a3 f8 40 00 00:34:33.732 READ FPDMA QUEUED
60 01 68 c0 a3 f8 40 00 00:34:33.732 READ FPDMA QUEUED
61 38 60 98 a1 a0 40 00 00:34:33.732 WRITE FPDMA QUEUED
60 00 58 c0 d6 84 40 00 00:34:33.732 READ FPDMA QUEUED

Error 124 occurred at disk power-on lifetime: 7222 hours (300 days + 22 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 41 4b ea d6 84 40 Error: UNC at LBA = 0x0084d6ea = 8705770

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 48 c0 d6 84 40 00 00:34:28.642 READ FPDMA QUEUED
2f 00 01 10 00 00 40 00 00:34:28.510 READ LOG EXT
61 40 40 58 a1 a0 40 00 00:34:23.543 WRITE FPDMA QUEUED
61 18 38 40 e4 89 40 00 00:34:23.542 WRITE FPDMA QUEUED
61 10 30 d8 96 89 40 00 00:34:23.542 WRITE FPDMA QUEUED

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 12934 -
# 2 Short offline Completed without error 00% 7 -
# 3 Extended offline Completed without error 00% 4 -
# 4 Short offline Completed without error 00% 2 -
# 5 Short offline Completed without error 00% 2 -
# 6 Short offline Completed without error 00% 0 -

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
 

keybored

Active Member
May 28, 2016
280
66
28
Not sure if it's a copy/paste issue, but some of those SMART values look insane. Like the Current Pending Sector value, which is at 13 gazillion.
The Reallocated Event Count looks to be reported correctly and it is almost at 3,000. At the same time, the Reallocated Sector Count is at 0, so I'm not sure if the drive keeps trying to reallocate (thus the high event count), but fails for some reason.

You can try filling the drive with random data a couple of times and watch SMART data. This might expose the problem (or brick the drive).
In some cases you can keep using drives if only a certain part of the surface is damaged. I have an old 2TB WD green drive that locks up during a zero-fill/erase test because the inner-most surface is damaged somehow. I created a partition that leaves the last few GB unallocated and have not had issues with it since then.
 

BLinux

cat lover server enthusiast
Jul 7, 2016
2,672
1,081
113
artofserver.com
Not sure if it's a copy/paste issue, but some of those SMART values look insane. Like the Current Pending Sector value, which is at 13 gazillion.
The Reallocated Event Count looks to be reported correctly and it is almost at 3,000. At the same time, the Reallocated Sector Count is at 0, so I'm not sure if the drive keeps trying to reallocate (thus the high event count), but fails for some reason.

You can try filling the drive with random data a couple of times and watch SMART data. This might expose the problem (or brick the drive).
In some cases you can keep using drives if only a certain part of the surface is damaged. I have an old 2TB WD green drive that locks up during a zero-fill/erase test because the inner-most surface is damaged somehow. I created a partition that leaves the last few GB unallocated and have not had issues with it since then.
no, not a copy & paste issue... those crazy numbers are what worry me. these are not the typical raw values i've seen before hence my asking; i don't always work with Fujitsu drives so I figure maybe someone here might know something i don't.