Need help with SMART attributes on newly bought lot of Intel S3500 Series

Discussion in 'Hard Drives and Solid State Drives' started by webuser1200, Jan 23, 2015.

  1. webuser1200

    webuser1200 Member

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    I recently bought 8 SSD S3500 Intel 600G (but marked with hp tags) drives. I was looking at the smart attributes on the drive and had the following questions (from my output which is listed below)

    1. Media_wearout_indicator is missing (Intel DC S3500 Series SSDs - Thomas-Krenn-Wiki

    2. I have a very high Program_Fail_Count_Chip raw value. Is this something of concern?

    3. Given the data below, is there any way for me to get an idea on how much life the drive has left?

    4. The power on hours seem to vary between 0 to 24 hours. Seems rather low. What is this attribute really saying?

    This is my first used SSD so please provide any help you can....



    ------------- Output from one of the drives:

    smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-32-generic] (local build)
    Copyright (C) 2002-13, Bruce Allen, Christian Franke, smartmontools

    === START OF INFORMATION SECTION ===
    Device Model: VK0600GDUTQ
    Serial Number: BTWL423500AZ600TGN
    LU WWN Device Id: 5 5cd2e4 04b66015e
    Firmware Version: 4IWVHPG1
    User Capacity: 600,127,266,816 bytes [600 GB]
    Sector Size: 512 bytes logical/physical
    Rotation Rate: Solid State Device
    Device is: Not in smartctl database [for details use: -P showall]
    ATA Version is: ATA8-ACS T13/1699-D revision 4
    SATA Version is: SATA 2.6, 6.0 Gb/s (current: 6.0 Gb/s)
    Local Time is: Fri Jan 23 18:48:38 2015 EST
    SMART support is: Available - device has SMART capability.
    SMART support is: Enabled

    === START OF READ SMART DATA SECTION ===
    SMART overall-health self-assessment test result: PASSED

    General SMART Values:
    Offline data collection status: (0x02) Offline data collection activity
    was completed without error.
    Auto Offline Data Collection: Disabled.
    Self-test execution status: ( 0) The previous self-test routine completed
    without error or no self-test has ever
    been run.
    Total time to complete Offline
    data collection: ( 2) seconds.
    Offline data collection
    capabilities: (0x79) SMART execute Offline immediate.
    No Auto Offline data collection support.
    Suspend Offline collection upon new
    command.
    Offline surface scan supported.
    Self-test supported.
    Conveyance Self-test supported.
    Selective Self-test supported.
    SMART capabilities: (0x0003) Saves SMART data before entering
    power-saving mode.
    Supports SMART auto save timer.
    Error logging capability: (0x01) Error logging supported.
    General Purpose Logging supported.
    Short self-test routine
    recommended polling time: ( 1) minutes.
    Extended self-test routine
    recommended polling time: ( 2) minutes.
    Conveyance self-test routine
    recommended polling time: ( 2) minutes.
    SCT capabilities: (0x0039) SCT Status supported.
    SCT Error Recovery Control supported.
    SCT Feature Control supported.
    SCT Data Table supported.

    SMART Attributes Data Structure revision number: 1
    Vendor Specific SMART Attributes with Thresholds:
    ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
    1 Raw_Read_Error_Rate 0x000f 130 130 039 Pre-fail Always - 1677
    5 Reallocated_Sector_Ct 0x0033 097 097 001 Pre-fail Always - 0
    9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 18
    173 Unknown_Attribute 0x0033 100 100 001 Pre-fail Always - 0
    175 Program_Fail_Count_Chip 0x0033 100 100 010 Pre-fail Always - 4295295622
    180 Unused_Rsvd_Blk_Cnt_Tot 0x003b 130 130 039 Pre-fail Always - 1677
    194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 20
    196 Reallocated_Event_Count 0x0033 100 100 010 Pre-fail Always - 0

    SMART Error Log Version: 1
    No Errors Logged

    SMART Self-test log structure revision number 1
    Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
    # 1 Short offline Completed without error 00% 0 -

    SMART Selective self-test log data structure revision number 1
    SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
    1 0 0 Not_testing
    2 0 0 Not_testing
    3 0 0 Not_testing
    4 0 0 Not_testing
    5 0 0 Not_testing
    Selective self-test flags (0x0):
    After scanning selected spans, do NOT read-scan remainder of disk.
    If Selective self-test is pending on power-up, resume after 0 minute delay.
     
    #1
  2. Patrick

    Patrick Administrator
    Staff Member

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    This is pretty common/ known issue. It has been mentioned in the forums and the used datacenter SSD buyer's guide and the HP 800gb Intel S3700 800GB deal posts on the main site over the past few weeks. HP drives do not have the wear indicator in SMART attributes. I think the S3500 800GB drives have about 450TBW endurance (or possibly more) and are not that old. So unless they had a full disk random small file size write per day workload, they are likely OK still.
     
    #2
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